New article in Journal of Micro/Nanolithography.

In my day job I work in the metrology field (that’s the science of measuring things), specifically, I work in atomic force microscopy where we make measurements at the nanometer scale. (Yes, I work in nanotechnology).

I have the coolest job!

In any case, we just had an article pass peer review and it is now published by the Journal of Micro/Nanolithography on their web site.  This is a publication by SPIE, the international organization for optics and photonics.

The abstract for the article can be found here: