In my day job I work in the metrology field (that’s the science of measuring things), specifically, I work in atomic force microscopy where we make measurements at the nanometer scale. (Yes, I work in nanotechnology).
I have the coolest job!
In any case, we just had an article pass peer review and it is now published by the Journal of Micro/Nanolithography on their web site. This is a publication by SPIE, the international organization for optics and photonics.
The abstract for the article can be found here: